Investigation of Al2O3 film-thickness by tunnel emission and capacitance measurements
- 30 November 1967
- journal article
- Published by Elsevier BV in Solid State Communications
- Vol. 5 (11), 867-870
- https://doi.org/10.1016/0038-1098(67)90317-1
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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