Ferromagnetic resonance linewidth for NM/80NiFe/NM films (NM=Cu, Ta, Pd and Pt)
- 1 May 2001
- journal article
- Published by Elsevier BV in Journal of Magnetism and Magnetic Materials
- Vol. 226-230, 1640-1642
- https://doi.org/10.1016/s0304-8853(00)01097-0
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology
- New Energy and Industrial Technology Development Organization
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