Resolving capabilities of phased array sectorial scans (S-scans) on diffracted tip signals
- 1 April 2006
- journal article
- Published by British Institute of Non-Destructive Testing (BINDT) in Insight - Non-Destructive Testing and Condition Monitoring
- Vol. 48 (4), 233-239
- https://doi.org/10.1784/insi.2006.48.4.233
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Ultrasonic backscatter sizing using phased array – developments in tip diffraction flaw sizingInsight - Non-Destructive Testing and Condition Monitoring, 2003
- Pipeline Girth Weld Inspections Using Ultrasonic Phased ArraysPublished by ASME International ,2002