Characterization of Thin Films
- 1 January 1992
- book chapter
- simple chapter
- Published by Elsevier BV
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Metallurgical applications of secondary ion mass spectrometry (SIMS)Journal of Materials Science, 1988
- A comparative study of methods for thin-film and surface analysisReports on Progress in Physics, 1984
- Ellipsometry in Thin Film AnalysisAnnual Review of Materials Science, 1981
- Principles and applications of ion beam techniques for the analysis of solids and thin filmsThin Solid Films, 1973
- Mass Transport along Grain Boundaries of SilverJournal of Applied Physics, 1972