Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

1 July 2015

conference paper
conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 1-5
https://doi.org/10.1109/redw.2015.7336722

Abstract

SmartFusion2 Flash-based Reprogrammable FPGAs are Neutron beam tested. Results confirm immunity of SEL and configuration upset with an elevated temperature approximately 95 ^oC. SEU is discussed for the Fabric Logic, Global logic, SRAM, PLL and SEFI on the MSS.

Keywords

PHASE LOCKED LOOPS
RANDOM ACCESS MEMORY
FIELD PROGRAMMABLE GATE ARRAYS
TESTING
SINGLE EVENT UPSETS
CLOCKS
FABRICS

This publication has 1 reference indexed in Scilit:

Configuration and Routing Effects on the SET Propagation in Flash-Based FPGAs
IEEE Transactions on Nuclear Science, 2008

Cited by 9 articles