Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering
Top Cited Papers
- 26 August 2009
- journal article
- review article
- Published by Elsevier BV in Surface Science Reports
- Vol. 64 (8), 255-380
- https://doi.org/10.1016/j.surfrep.2009.07.002
Abstract
No abstract availableKeywords
This publication has 499 references indexed in Scilit:
- Looking by grazing incidence small angle x-ray scattering at gold nanoparticles supported on rutile TiO2(110) during CO oxidationGold Bulletin, 2008
- The influence of substrate morphology on the growth of thin silicon films: A GISAXS studyThin Solid Films, 2007
- Coherent X-ray imaging of individual islands in GISAXS geometryThin Solid Films, 2007
- Si nanocrystals in SiO2 films analyzed by small angle X-ray scatteringThin Solid Films, 2007
- Structural characterization of thin amorphous Si filmsThin Solid Films, 2007
- Combined scanning tunneling microscopy and reflectance anisotropy spectroscopy study of self-organized anisotropic cobalt nanodots on a vicinal Au(111) surfacePhysical Review B, 2004
- Solution to the phase problem for specular x-ray or neutron reflectivity from thin films on liquid surfacesPhysical Review B, 2003
- High resolution transmission electron microscopy studies of the Ag/MgO interfaceActa Metallurgica et Materialia, 1992
- Molecular beam epitaxial growth of Cr/Fe, Ag/Fe, Ag/Cr and Ag/Co superlattices on MgO (001) substratesJournal of Crystal Growth, 1991
- Critical surface scattering of x-rays at grazing anglesZeitschrift für Physik B Condensed Matter, 1984