Scanning tunneling microscope combined with a scanning electron microscope
- 1 February 1986
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 57 (2), 221-224
- https://doi.org/10.1063/1.1138973
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Tunneling Spectroscopy and Inverse Photoemission: Image and Field StatesPhysical Review Letters, 1985
- Technological applications of scanning tunneling microscopy at atmospheric pressureApplied Physics Letters, 1985
- High-stability scanning tunneling microscopeReview of Scientific Instruments, 1985
- The Scanning Tunneling MicroscopeScientific American, 1985
- Charge-density waves observed with a tunneling microscopePhysical Review Letters, 1985
- Determination of surface topography of biological specimens at high resolution by scanning tunnelling microscopyNature, 1985
- Real-space observation of the reconstruction of Au(100)Surface Science, 1984
- Electromagnetic squeezer for compressing squeezable electron tunneling junctionsReview of Scientific Instruments, 1984
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982