Current conveyor based test structures for mixed-signal circuits
- 1 January 1997
- journal article
- Published by Institution of Engineering and Technology (IET) in IEE Proceedings - Circuits, Devices and Systems
- Vol. 144 (4), 213
- https://doi.org/10.1049/ip-cds:19971212
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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