Interferometric study of piezoelectric degradation in ferroelectric thin films
- 31 December 1995
- journal article
- Published by Elsevier BV in Microelectronic Engineering
- Vol. 29 (1-4), 261-264
- https://doi.org/10.1016/0167-9317(95)00157-3
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- PZT films for micro-pumpsIntegrated Ferroelectrics, 1995
- Voltage offsets in (Pb,La)(Zr,Ti)O3 thin filmsApplied Physics Letters, 1995
- Domain wall clamping in ferroelectrics by orientation of defectsJournal of Applied Physics, 1993
- A comparison of ferroelectric aging in bulk and thin-film materialsJournal of Applied Physics, 1992
- A sensitive double beam laser interferometer for studying high-frequency piezoelectric and electrostrictive strainsReview of Scientific Instruments, 1989
- Review of literature on aging of dielectricsFerroelectrics, 1988
- Laser interferometer for the study of piezoelectric and electrostrictive strainsJournal of Applied Physics, 1988
- The nature of domain stabilization in ferroelectric perovskitesJournal of Physics and Chemistry of Solids, 1986
- Electrical after-effects in Pb(Ti, Zr)O3 ceramicsFerroelectrics, 1977