Analytical descriptions of the tapping-mode atomic force microscopy response
- 21 December 1998
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 73 (25), 3781-3783
- https://doi.org/10.1063/1.122893
Abstract
The tapping-mode atomic force microscopy response has been analyzed by the Krylov–Bogolubov–Mitropolsky asymptotic method. Due to the presence of repulsive force, attractive force and damping in the tip-sample interaction, the response exhibits complicate nonlinear phenomena. The numerical and experimental results shows that the phenomena can be well described by this approximation solution when the driving frequency is close to the free resonance frequency and the setpoint amplitude ratio is larger than 0.4.Keywords
This publication has 12 references indexed in Scilit:
- How does a tip tap?Nanotechnology, 1997
- Phase imaging and stiffness in tapping-mode atomic force microscopySurface Science, 1997
- Density functional cluster studies on the (010) surface of vanadium pentoxideSurface Science, 1997
- Imaging material properties by resonant tapping-force microscopy: A model investigationPhysical Review B, 1996
- Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operationJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Deformation, Contact Time, and Phase Contrast in Tapping Mode Scanning Force MicroscopyLangmuir, 1996
- Imaging elastic sample properties with an atomic force microscope operating in the tapping modeUltramicroscopy, 1995
- Interpretation of force curves in force microscopyNanotechnology, 1993
- From Molecules to Cells: Imaging Soft Samples with the Atomic Force MicroscopeScience, 1992
- Machining Oxide Thin Films with an Atomic Force Microscope: Pattern and Object Formation on the Nanometer ScaleScience, 1992