Determination of Atomic Positions in a Solid Xe Precipitate Embedded in an Al Matrix
- 12 April 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 82 (15), 3082-3084
- https://doi.org/10.1103/physrevlett.82.3082
Abstract
The atomic structure of precipitates embedded in crystalline membranes was observed for the first time by high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) with an electron probe in an atomic dimension. The experimental image was analyzed by taking a line profile and was compared with the calculated intensities obtained from the multislice based HAADF-STEM simulation. A model shifting Xe atoms slightly from the on-site of the Al matrix in the [100] direction agreed well with the experimental profile and image. From these results, the small displacement of Xe atoms to the Al matrix is estimated at about 0.5 Å.Keywords
This publication has 14 references indexed in Scilit:
- High Angle Dark Field STEM for Advanced MaterialsJournal of Electron Microscopy, 1996
- Radiation effects and gas cavities in pyrolytic graphite implanted with helium ionsJournal of Nuclear Materials, 1996
- Instrumental factors in high-resolution FEG STEMUltramicroscopy, 1995
- Dynamic theory of high-angle annular-dark-field stem lattice images for a Ge/Si interfaceUltramicroscopy, 1990
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990
- Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scatteringUltramicroscopy, 1989
- High resolution imaging of crystalline xenon and xenon alloys in aluminumJournal of Nuclear Materials, 1989
- Dynamic behavior of bubbles and blisters in aluminum during helium ion irradiation in an electron microscopeJournal of Nuclear Materials, 1988
- Lattice Images of Solid Xenon Precipitates in Aluminum at Room TemperatureScience, 1985
- Multislice formula for inclined illuminationActa Crystallographica Section A, 1982