Evaluation of a scanning transmission x-ray microscope using undulator radiation at the SERC Daresbury Laboratory
- 1 April 1989
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 22 (4), 234-238
- https://doi.org/10.1088/0022-3735/22/4/006
Abstract
A scanning transmission x-ray microscope with Fresnel zone-plate focusing optics has been used to form images with monochromatic 400 eV x-rays. In initial experiments on the undulator beamline at the SERC Daresbury Laboratory's synchrotron radiation source, a resolution of about 150 nm has been achieved with a focused x-ray flux of more than 104 photons per second.Keywords
This publication has 14 references indexed in Scilit:
- The Gottingen Scanning X-ray MicroscopePublished by SPIE-Intl Soc Optical Eng ,1986
- Soft X-ray nano lithography of semitransparent masks for the generation of high-resolution high contrast zone platesAIP Conference Proceedings, 1986
- Soft-X-Ray MicroscopesPhysics Today, 1985
- Contamination Lithography For The Fabrication Of Zone Plate X-Ray LensesPublished by SPIE-Intl Soc Optical Eng ,1985
- Absorption microanalysis with a scanning soft X‐ray microscope: mapping the distribution of calcium in boneJournal of Microscopy, 1985
- Soft x-ray microscopesReview of Scientific Instruments, 1985
- Development of an undulator for the SRSNuclear Instruments and Methods in Physics Research, 1983
- The plane grating and elliptical mirror: A new optical configuration for monochromatorsOptics Communications, 1982
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982
- A Scanning X-Ray Microscope Using Synchrotron RadiationScience, 1972