Si(Li) semiconductor detector in angle and energy dispersive X-ray diffractometry
- 1 November 1974
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 7 (11), 951-954
- https://doi.org/10.1088/0022-3735/7/11/026
Abstract
An X-ray diffractometer system is described with which angle dispersive, energy dispersive and combined angle and energy dispersive diffraction measurements can be carried out. The appropriateness and the advantages of these methods under different experimental conditions are discussed. The preliminary measurements have shown promising results in using other than characteristic wavelengths in angle dispersive X-ray diffractometry. A combined angle and energy dispersive method is realized experimentally.Keywords
This publication has 16 references indexed in Scilit:
- Rapid determination of polarity sense by an energy-dispersive diffractometerJournal of Applied Crystallography, 1973
- Escape peaks caused by a Ge(Li) detector in an energy-dispersive diffractometerJournal of Applied Crystallography, 1973
- The precision of interplanar distances measured by an energy-dispersive diffractometerJournal of Applied Crystallography, 1973
- Adaptation of solid state detector in X-Ray powder diffractometryX-Ray Spectrometry, 1972
- A semiconductor detector in a small angle X-ray diffraction studyJournal of Physics E: Scientific Instruments, 1972
- Structure and microstructure study on splat-cooled cadmiumJournal of Materials Science, 1971
- Application of semiconductor detectors in crystal structure investigationsphysica status solidi (a), 1971
- Bragg's law and energy sensitive detectorsJournal of Applied Crystallography, 1970
- Fluorescence elimination in x-ray diffractometry with solid state detectorsMaterials Research Bulletin, 1970
- Density of the Lunar SurfaceScience, 1968