Coupling dielectric waveguide modes to surface plasmon polaritons
Open Access
- 27 June 2008
- journal article
- Published by Optica Publishing Group in Optics Express
- Vol. 16 (14), 10455-10464
- https://doi.org/10.1364/oe.16.010455
Abstract
We study dielectric/metal thin film multilayers designed for the coupling of dielectric waveguide modes and surface plasmons. The coupling as identified in calculated dispersion relations for extended multilayers is confirmed by measured angle-resolved reflectance data. By lateral structuring of the multilayers the mutual coupling of dielectric and plasmonic modes is directly observed by fluorescence based microscopy. For a light wavelength of 514nm we find a coupling length of 15µm. Our results highlight the potential of hybrid dielectric/metal waveguides for integrating surface plasmon based photonic circuitry or sensing elements into conventional optical devices.Keywords
This publication has 12 references indexed in Scilit:
- Fluorescence microscopy in a microwave cavityOptics Express, 2007
- Metrology of replicated diffractive optics with Mueller polarimetry in conical diffractionOptics Express, 2007
- Selective probing and imaging in random media based on the elimination of polarized scatteringOptics Express, 2007
- Ellipsometry with polarisation-entangled photonsOptics Express, 2006
- Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulksOptics Express, 2005
- Elimination of polarized light scattered by surface roughness or bulk heterogeneityOptics Express, 2005
- Full-field birefringence imaging by thermal-light polarization-sensitive optical coherence tomography I TheoryApplied Optics, 2003
- Degree of polarization in laser speckles from turbid media: Implications in tissue opticsJournal of Biomedical Optics, 2002
- Comparison of surface and bulk scattering in optical multilayersApplied Optics, 1993
- Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation propertiesApplied Optics, 1983