Experimental determination of the edge depletion width of ahe two-dimensional electron gas in GaAs/AlxGa1−xAs

Abstract
A new method based on one‐dimensional localization theory is introduced to determine the width of the two‐dimensional electron gas (2DEG) in narrow conducting channels of GaAs/AlxGa1−xAs heterojunctions. The edge depletion width of the 2DEG, measured by the difference between this width and the metallurgical width of the channel, is ∼0.5 μm±0.2 μm for a 2DEG density ns=1.5×1011/cm2.