Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques
- 31 May 2003
- journal article
- Published by Elsevier BV in Scripta Materialia
- Vol. 48 (9), 1331-1336
- https://doi.org/10.1016/s1359-6462(03)00019-8
Abstract
No abstract availableKeywords
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