Ultrafast Clock Recovery and Sampling by Single Parametric Device
- 18 November 2010
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 23 (3), 191-193
- https://doi.org/10.1109/LPT.2010.2093123
Abstract
We propose and demonstrate a new architecture that combines clock recovery and signal processing functions in a single fiber device. By using parasitic cross-phase modulation of idler wave generated within the parametric sampling gate, rate-variable self-synchronized demultiplexing was demonstrated. Rigorous measurements confirm stable, high sensitivity performance at a maximal rate of 640 Gb/s, even when the input signal is subject to a rapid transient.Keywords
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