RDIS: A recursively defined invertible set scheme to tolerate multiple stuck-at faults in resistive memory
- 1 June 2012
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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