Defect edge identification with rectangular pulsed eddy current sensor based on transient response signals
- 31 July 2010
- journal article
- Published by Elsevier BV in NDT & E International
- Vol. 43 (5), 409-415
- https://doi.org/10.1016/j.ndteint.2010.03.007
Abstract
No abstract availableKeywords
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