Experimental evaluation of a simple model for quantitative analysis in X-ray photoelectron spectroscopy
- 31 December 1974
- journal article
- Published by Elsevier BV in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 5 (1), 827-835
- https://doi.org/10.1016/0368-2048(74)85055-3
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Relative intensities in x-ray photoelectron spectraJournal of Electron Spectroscopy and Related Phenomena, 1973
- Study of the x-ray photoelectron spectrum of tungsten—tungsten oxide as a function of thickness of the surface oxide layerJournal of Electron Spectroscopy and Related Phenomena, 1973
- Electron spectroscopy for chemical analysis of nickel compoundsInorganic Chemistry, 1973
- Dependence of the angular distribution of atomic photoelectrons on energy and Z: I. p-SubshellsJournal of Electron Spectroscopy and Related Phenomena, 1972
- Sensitivity of detection of the elements by photoelectron spectrometryAnalytical Chemistry, 1972
- Range of Excited Electrons in MetalsPhysical Review B, 1962