Voltage-aware chip-level design for reliability-driven pin-constrained EWOD chips
- 5 November 2012
- conference paper
- conference paper
- Published by Association for Computing Machinery (ACM) in Proceedings of the International Conference on Computer-Aided Design - ICCAD '12
- p. 353-360
- https://doi.org/10.1145/2429384.2429461
Abstract
No abstract availableFunding Information
- National Science Council Taiwan (NSC 101-2220-E-006-016101-2628-E-006-018-MY3)
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