X‐Ray photoelectron spectroscopic studies of the surface of sputter ion plated films
- 1 December 1984
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 6 (6), 261-266
- https://doi.org/10.1002/sia.740060603
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Auger and x-ray characterization of surface nitride films on Ti, Zr, and HfJournal of Vacuum Science and Technology, 1982
- Data analysis techniques in x-ray photoelectron spectroscopyAnalytical Chemistry, 1982
- Oxidation kinetics of TiN thin filmsJournal of Applied Physics, 1981
- Auger and Coster-Kronig broadening effects in the 2p and 3p photoelectron spectra from the metals22Ti-30ZnJournal of Physics F: Metal Physics, 1981
- Smoothing of digital x-ray photoelectron spectra by an extended sliding least-squares approachAnalytical Chemistry, 1980
- X-ray photoelectron spectroscopic studies of electrode surfaces using a new controlled transfer techniqueJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1979
- Simple metalsPublished by Springer Science and Business Media LLC ,1979
- Charge transfer shake-up satellites in X-ray photoelectron spectra of cations and anions of SrTiO3, TiO2 and Sc2O3Chemical Physics Letters, 1975
- Multi-electron satellites in core electron photoemission from 3d0ions in solidsJournal of Physics C: Solid State Physics, 1973
- Formation and reactivity of nitrides. IV. Titanium and zirconium nitridesJournal of Applied Chemistry, 1969