System-level design for test of fully differential analog circuits
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 31 (10), 1526-1534
- https://doi.org/10.1109/4.540065
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- The design of analog self-checking circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Designing self-exercising analogue checkersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- System-Level Design for Test of Fully Differential Analog CircuitsProceedings of the 39th conference on Design automation - DAC '02, 1995
- Improving the testability of switched-capacitor filtersAnalog Integrated Circuits and Signal Processing, 1993
- Design of concurrent error detectable current-mode A/D converters for real-time applicationsAnalog Integrated Circuits and Signal Processing, 1993
- Built-in self-test structure for mixed-mode circuitsIEEE Transactions on Instrumentation and Measurement, 1993
- A low-noise chopper-stabilized differential switched-capacitor filtering techniqueIEEE Journal of Solid-State Circuits, 1981