Evidence of negative charge trapping in high temperature annealed thermal oxide
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (3), 473-478
- https://doi.org/10.1109/23.299787
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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