COMPACTEST: a method to generate compact test sets for combinational circuits
- 1 July 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 12 (7), 1040-1049
- https://doi.org/10.1109/43.238040
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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