Light‐Induced Bipolar‐Resistance Effect Based on Metal–Oxide–Semiconductor Structures of Ti/SiO2/Si
- 24 February 2010
- journal article
- Published by Wiley in Advanced Materials
- Vol. 22 (9), 966-970
- https://doi.org/10.1002/adma.200903070
Abstract
No abstract availableKeywords
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