Synthesis and single-crystal X-ray diffraction studies of new framework substituted type II clathrates, Cs8Na16AgxGe136−x (x<7)
- 14 January 2007
- journal article
- Published by Elsevier BV in Journal of Solid State Chemistry
- Vol. 180 (3), 1076-1082
- https://doi.org/10.1016/j.jssc.2007.01.003
Abstract
No abstract availableKeywords
This publication has 25 references indexed in Scilit:
- A guest-free germanium clathrateNature, 2006
- Exceptional Ideal Strength of Carbon ClathratesPhysical Review Letters, 2004
- Rattling guest atoms in Si, Ge, and Sn‐based type‐II clathrate materialsPhysica Status Solidi (b), 2003
- Preparation, Transport Properties, and Structure Analysis by Resonant X-ray Scattering of the Type I Clathrate Cs8Cd4Sn42Chemistry of Materials, 2002
- Low-density framework form of crystalline silicon with a wide optical band gapPhysical Review B, 2000
- Superconductivity in the Silicon Clathrate Compound (Na,Ba)SPhysical Review Letters, 1995
- Neue ternäre intermetallische Verbindungen mit Clathratstruktur: Ba8(T,Si)6Si40 und Ba6(T,Ge)6Ge40 mit T ≡ Ni, Pd, Pt, Cu, Ag, AuJournal of the Less Common Metals, 1991
- Die verbindungen AII8BIII16BIV30 (AII ≡ Sr, Ba; BIII≡ Al, Ga; BIV ≡ Si, Ge, Sn) und ihre käfigstrukturenJournal of the Less Common Metals, 1986
- A profile refinement method for nuclear and magnetic structuresJournal of Applied Crystallography, 1969
- Effective ionic radii in oxides and fluoridesActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969