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A testability metric for path delay faults and its application
Home
Publications
A testability metric for path delay faults and its application
A testability metric for path delay faults and its application
HT
Huan-Chih Tsai
Huan-Chih Tsai
KC
Kwang-Ting Cheng
Kwang-Ting Cheng
VA
Vishwani D. Agrawal
Vishwani D. Agrawal
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1 January 2000
conference paper
Published by
Association for Computing Machinery (ACM)
p.
593-598
https://doi.org/10.1145/368434.368820
Abstract
No abstract available
Cited by 8 articles