Secondary electron emission characteristics of oxidized beryllium cathodes
- 1 April 1988
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 11 (6-7), 389-397
- https://doi.org/10.1002/sia.740110620
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Analysis of oxygen on and in beryllium using 2 MeV helium ionsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Bonding information from Auger spectroscopyApplications of Surface Science, 1985
- Auger lineshape analysis of carbon bonding in sputtered metal-carbon thin filmsSurface Science, 1983
- Comparison of Auger signals measured using differential and integral Auger spectra from C and O adsorbed on WJournal of Vacuum Science and Technology, 1978
- Electron-beam induced reduction of carbon concentration on BeO and its effects on secondary electron emissionSurface Science, 1973
- Fast, Accurate Secondary-Electron Yield Measurements at Low Primary EnergiesReview of Scientific Instruments, 1973
- The continuous-cathode (emitting-sole) crossed-field amplifierProceedings of the IEEE, 1973
- Contaminants on chemically etched silicon surfaces: LEED-Auger methodSurface Science, 1970
- Identification of the form of carbon at a Si (100) surface using auger electron spectroscopyPhysics Letters A, 1970
- The dissociative electronic desorption of carbon monoxide from tungstenSurface Science, 1968