Dimensional Micro and Nano Metrology
- 1 January 2006
- journal article
- Published by Elsevier BV in CIRP Annals
- Vol. 55 (2), 721-743
- https://doi.org/10.1016/j.cirp.2006.10.005
Abstract
No abstract availableThis publication has 99 references indexed in Scilit:
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