Design and input-shaping control of a novel scanner for high-speed atomic force microscopy
- 1 June 2008
- journal article
- Published by Elsevier BV in Mechatronics
- Vol. 18 (5-6), 282-288
- https://doi.org/10.1016/j.mechatronics.2008.02.007
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
- Components for high speed atomic force microscopyUltramicroscopy, 2006
- Data acquisition system for high speed atomic force microscopyReview of Scientific Instruments, 2005
- A mechanical microscope: High-speed atomic force microscopyApplied Physics Letters, 2005
- Trade-offs and performance limitations in mechatronic systems: a case studyAnnual Reviews in Control, 2004
- Millipede-a MEMS-based scanning-probe data-storage systemIEEE Transactions on Magnetics, 2003
- A high-speed atomic force microscope for studying biological macromoleculesProceedings of the National Academy of Sciences of the United States of America, 2001
- Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy ApplicationJournal of Dynamic Systems, Measurement, and Control, 1999
- Quantitative manipulation of DNA and viruses with the nanomanipulator scanning force microscopeSurface and Interface Analysis, 1999
- Imaging Crystals, Polymers, and Processes in Water with the Atomic Force MicroscopeScience, 1989
- Atomic Force MicroscopePhysical Review Letters, 1986