Large modification of crystal–melt interface shape during Si crystal growth by using electromagnetic Czochralski method (EMCZ)
- 1 July 2006
- journal article
- Published by Elsevier BV in Journal of Crystal Growth
- Vol. 292 (2), 252-256
- https://doi.org/10.1016/j.jcrysgro.2006.04.047
Abstract
No abstract availableKeywords
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