Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images
- 1 October 2013
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 133, 109-119
- https://doi.org/10.1016/j.ultramic.2013.07.002
Abstract
No abstract availableKeywords
Funding Information
- EPSRC
- Johnson Matthey
- Australian Research Council
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