Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair
- 1 April 2013
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 38 (7), 1173-1175
- https://doi.org/10.1364/ol.38.001173
Abstract
We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.Funding Information
- Engineering and Physical Sciences Research Council (EP/G067694/1)
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