Oxidation kinetics forNi(111)and the structure of the oxide layers

Abstract
The oxidation kinetics for Ni(111) surface and the structure of the oxide layers grown at room temperature were analyzed by high-resolution medium energy ion scattering using isotopically labeled O218. Initially, the surface showed a reflection high energy electron diffraction (RHEED) pattern of the Ni(111)(2×2)O chemisorption structure at an oxygen exposure of a few langmuir (1L:106Torrs) and started to form NiO(111) layers above 10L. The oxide thickness was saturated with six atomic layers at oxygen exposure of 160L. The saturated NiO(111) surface shows a (1×1) RHEED pattern not p(2×2) and consists of two domains: NiO(111)[112¯]Ni(111)[112¯] (primary) and NiO(111)[11¯0]Ni(111)[112¯](a small fraction). The elemental depth profile corresponds to the octopolar reconstruction terminated with Ni (0.25ML) [1ML=1.33×1015atomscm2: areal density of NiO(111)]. The oxide surface grown epitaxially probably takes a precursor state of the octopolar structure with significant distortion because of a large lattice mismatch of 19% between NiO(111) and Ni(111). Tow step oxidation using O218 and O216 clearly indicates that oxidation takes place at the top surface obeying the Cabrera-Mott mechanism. The potential barrier for the jump from Ni into the NiO layer is derived to be 2.36eV.