Strains, planes, and EBSD in materials science
Top Cited Papers
Open Access
- 1 September 2012
- journal article
- review article
- Published by Elsevier BV in Materials Today
- Vol. 15 (9), 366-376
- https://doi.org/10.1016/s1369-7021(12)70163-3
Abstract
No abstract availableKeywords
This publication has 86 references indexed in Scilit:
- Analysis of local chemical and structural inhomogeneities in FeySe1−xTex single crystalsApplied Physics Letters, 2011
- New Method of Transmission Electron Diffraction to Characterize Nanomaterials in the SEMMicroscopy and Microanalysis, 2011
- A Novel Multi-Modal 3D Characterization System to Quantify Grain-Level Microstructural Features in Macro-Scale VolumesMicroscopy and Microanalysis, 2011
- High-resolution electron backscatter diffraction: An emerging tool for studying local deformationThe Journal of Strain Analysis for Engineering Design, 2010
- Electron backscatter diffraction: Strategies for reliable data acquisition and processingMaterials Characterization, 2009
- 3D polycrystalline microstructure reconstruction from FIB generated serial sections for FE analysisComputational Materials Science, 2007
- 3D reconstruction and characterization of polycrystalline microstructures using a FIB–SEM systemMaterials Characterization, 2006
- Use of electropolishing for enhanced metallic specimen preparation for electron backscatter diffraction analysisMaterials Characterization, 2005
- EBSD measurement of strains in GaAs due to oxidation of buried AlGaAs layersMicroelectronic Engineering, 2004
- Development of grain misorientation texture, in terms of coincident site lattice structures, as a function of thermomechanical treatmentsPhilosophical Magazine A, 1989