Photoconductive frequency-resolved spectroscopy of semiconductors: an analysis of lifetime distributions
- 1 July 1993
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 8 (7), 1277-1282
- https://doi.org/10.1088/0268-1242/8/7/015
Abstract
The authors present an analysis, in the frequency domain, of the carrier recombination kinetics most frequently encountered in semiconductor systems under quasistatic excitation. The analysis can be used to interpret carrier lifetime distributions obtained in frequency-resolved spectroscopy experiments. The effect of trapping on the lifetime distribution is analysed in detail and the authors discuss how frequency-resolved spectroscopy can be used to obtain the major trap parameters.Keywords
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