Metrological characterization of X-ray diffraction methods for determination of crystallite size in nano-scale materials
- 3 November 2006
- journal article
- Published by Elsevier BV in Materials Characterization
- Vol. 58 (10), 883-891
- https://doi.org/10.1016/j.matchar.2006.09.002
Abstract
No abstract availableKeywords
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