Wafer Scale Synthesis and High Resolution Structural Characterization of Atomically Thin MoS2 Layers
- 30 September 2014
- journal article
- research article
- Published by Wiley in Advanced Functional Materials
- Vol. 24 (47), 7461-7466
- https://doi.org/10.1002/adfm.201402519
Abstract
No abstract availableThis publication has 36 references indexed in Scilit:
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