Abstract
The present study uses the energy dispersive X-ray diffraction (EDXD) technique to determine the average local distributions of Cs + ions in silicate glasses with the compositions Cs 2 O·3.4 SiO 2 and (0.405 Cs 2 O + 0.595 Na 2 O) · 3 SiO 2 . The data show that the local structure around Cs + ions is very similar in the single and mixed alkali glasses, despite large differences in their ionicconductivities. No evidence of pairing or mixing of Cs + and Na + ions is seen, suggesting that the different ions may segregate submicroscopically into separate regions in the glass.

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