Use of PuBe source to simulate neutron-induced single event upsets in static RAMs
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6), 1523-1528
- https://doi.org/10.1109/23.25491
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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