XPS study of the growth kinetics of thin films obtained by thermal oxidation of germanium substrates
- 30 June 1999
- journal article
- Published by Elsevier BV in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 101-103, 233-238
- https://doi.org/10.1016/s0368-2048(98)00451-4
Abstract
No abstract availableKeywords
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