X-ray photoelectron spectroscopy study of phosphorus incorporation in anodic oxide films on niobium
- 1 May 1986
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 139 (1), 67-75
- https://doi.org/10.1016/0040-6090(86)90049-0
Abstract
No abstract availableKeywords
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