Anisotropic penetration depth in La2xSrxCuO4

Abstract
The surface impedance at 10 GHz was measured systematically in single-crystal La2x Srx CuO4 for carrier concentrations 0.09≤x≤0.19, from which penetration depth λ was determined. The anisotropy and the depencences on x and temperature T of λ are extensively studied for the first time. The anisotropy of λ(T=0) decreases with increasing x, and still remains larger than 10 for x=0.19. The out-of-plane penetration depth (λc) has a different temperature dependence from the in-plane one (λab). These results suggest that the electrodynamic properties in the superconducting state along the c axis can be explained by a Josephson-coupled layer model.