A new particle sampling technique for direct analysis using total-reflection X-ray fluorescence spectrometry
- 28 February 1993
- journal article
- Published by Elsevier BV in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 48 (2), 231-238
- https://doi.org/10.1016/0584-8547(93)80028-s
Abstract
No abstract availableKeywords
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