Overall equipment effectiveness (OEE) and cost measurement [semiconductor manufacturing]
- 23 December 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Activity based enterprise analysis through modelingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Modeling the cost of ownership of assembly and inspectionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Capacity utilization bottleneck efficiency system-CUBESIEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A, 1995