Study of C60 thin films by scanning tunnelling microscopy: pressure-induced transformation to an amorphous carbon phase
- 29 February 1996
- journal article
- Published by Elsevier BV in Synthetic Metals
- Vol. 77 (1-3), 161-164
- https://doi.org/10.1016/0379-6779(96)80079-8
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Determination of the C70/C60 ratio in fullerene thin film as a function of the sublimation distance and the substrate temperature using scanning tunnelling microscopyPhilosophical Magazine Part B, 1994
- X-ray study of pressure-collapsed fulleritePhysical Review B, 1993
- Determination of C60/C70 ratios in fullerene mixtures and film characterization by scanning tunneling microscopyApplied Physics A, 1993
- Gap reduction and the collapse of solidto a new phase of carbon under pressurePhysical Review Letters, 1992
- Phase Transformations in Carbon Fullerenes at High Shock PressuresScience, 1991
- Absence of a metallic phase at high pressures in C60Nature, 1991
- Imaging C60 clusters on a surface using a scanning tunnelling microscopeNature, 1990
- Scanning tunnelling microscopy of solid C60/C70Nature, 1990
- Direct measurement of forces during scanning tunneling microscope imaging of graphiteSurface Science, 1989
- Contamination-mediated deformation of graphite by the scanning tunneling microscopePhysical Review B, 1986