SPICE simulation of electro-thermal effects in new-generation multicellular VDMOS transistors
- 31 December 2001
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Thermal analysis of solid-state devices and circuits: an analytical approachSolid-State Electronics, 2000
- Thermal instability of low voltage power-MOSFETsIEEE Transactions on Power Electronics, 2000
- Study of the quasi-saturation effect in VDMOS transistorsIEEE Transactions on Electron Devices, 1986