Active appearance models
Top Cited Papers
- 1 June 2001
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. 23 (6), 681-685
- https://doi.org/10.1109/34.927467
Abstract
We describe a new method of matching statistical models of appearance to images. A set of model parameters control modes of shape and gray-level variation learned from a training set. We construct an efficient iterative matching algorithm by learning the relationship between perturbations in the model parameters and the induced image errors.Keywords
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