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Long-range depth imaging using time-correlated single-photon counting
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Long-range depth imaging using time-correlated single-photon counting
Long-range depth imaging using time-correlated single-photon counting
NK
Nils J. Krichel
Nils J. Krichel
Aongus McCarthy
Aongus McCarthy
Andrew M. Wallace
Andrew M. Wallace
JY
Jing Ye
Jing Ye
Gerald S. Buller
Gerald S. Buller
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19 August 2010
conference paper
Published by
SPIE-Intl Soc Optical Eng
in
SPIE NanoScience + Engineering
Vol. 7780
,
77801
https://doi.org/10.1117/12.876144
Abstract
Active, three-dimensional long-range imaging has varied applications in a number of disciplines, including manufacturing, environmental sensing and defence. Common constraints often include low average and peak illumination powers to ensure eye-safety, making the potentially high sensitivity of the single-photon counting technique a distinct advantage. We present a scanning time-of-flight imager based on high repetition-rate (>MHz) pulsed illumination and a silicon single-photon detector. In advanced photon-counting experiments, we recently employed the system for unambiguous range resolution at several kilometres target distance, multiple-surface resolution based on adaptive algorithms, and a cumulative data acquisition method that facilitates detector characterisation and evaluation. This article reviews these achievements and identifies multi-spectral imaging as a possible future application.© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Keywords
TIME OF FLIGHT
ALGORITHMS
SENSORS
MANUFACTURING
CUMULANT
MULTISPECTRAL IMAGING
DATA ACQUISITION
THREE DIMENSIONAL
SILICON
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Open Access
Cited by 2 articles